Educational guide School of Chemical Engineering |
english |
Nanoscience, Materials and Processes: Chemical Technology at the Frontier |
Subjects |
MATERIALS: SYMMETRY AND PROPERTIES |
Contents |
IDENTIFYING DATA | 2014_15 |
Subject | MATERIALS: SYMMETRY AND PROPERTIES | Code | 20705215 | |||||
Study programme |
|
Cycle | 2nd | |||||
Descriptors | Credits | Type | Year | Period | ||||
3 | Optional | AN |
Competences | Learning outcomes | Contents |
Planning | Methodologies | Personalized attention |
Assessment | Sources of information | Recommendations |
Topic | Sub-topic |
1. - Symmetry in crystalline materials. | Introduction to Crystallography. Basic terminology. Symbols and terms. Point groups of crystal symmetry. Space groups of crystal symmetry. |
2.-Anisotropy of the physical properties of materials. | Physical properties such as tensile. Basic terminology. Top of Newman. Compatibility between symmetry and physical property. The value of a property in a certain direction. Curie Principle: Influence of an external agent of change in a material symmetry. |
3.-Relationship between crystal structure and morphology of crystals. | Nucleation and crystal growth. Size and shape of the crystals / particles depending on growth conditions. Principles Curie and Wulff theorem by way of balance and growth. Types of surfaces of crystalline materials. |
4.- Characterization of the materials X-ray diffraction. | Diffraction technique polycrystalline material. The intensities of the diffracted rays: Factor structure and its applications. Identification of unknown phases. Measurements of crystal cell parameters. Refinement of crystal structures by X-ray diffraction. X-ray diffraction with high-temperature chamber. Polymorphism and phase transition by varying temperature. Expansion of a crystalline material by X-ray diffraction. Thermal expansion tensor of anisotropic materials. |
5.-Characterization of the texture of the materials. | Dimensional diffraction X-ray. Ewald sphere. Goniometer for texture analysis. Euler goniometer geometry of Schulz. Characterization of thin layers. Orientation of crystalline materials for cutting |