| Educational guide School of Engineering |
english |
| Electronic Engineering (2010) |
 Subjects |
| CHARACTERIZATION OF CRYSTALS, NANOCRYSTALS AND NANOSTRUCTURED MATERIALS BY X-R DIFFRACTION METHODS |
| Competences |
| IDENTIFYING DATA | 2011_12 |
| Subject | CHARACTERIZATION OF CRYSTALS, NANOCRYSTALS AND NANOSTRUCTURED MATERIALS BY X-R DIFFRACTION METHODS | Code | 17605221 | |||||
| Study programme |
|
Cycle | 2nd | |||||
| Descriptors | Credits | Type | Year | Period | ||||
| 3 | Optional | Only annual |
||||||
| Competences | Learning aims | Contents |
| Planning | Methodologies | Personalized attention |
| Assessment | Sources of information | Recommendations |
| Type A | Code | Competences Specific |
| Professional | ||
| AP2 | Dissenyar i desenvolupar experiments científics, així com analitzar i interpretar dades i resultats. | |
| Research | ||
| AR1 | Conèixer els processos de disseny, fabricació i verificació de sistemes microelectrònics en general i sistemes MEMS o amb sensors en particular. | |
| Type B | Code | Competences Transversal |
| Common | ||
| BC2 | Treballar autònomament amb iniciativa | |
| Type C | Code | Competences Nuclear |
| Common | ||
