2011_12
Educational guide 
School of Engineering
A A A 
english 
Electronic Engineering (2010)
 Subjects
  CHARACTERIZATION OF CRYSTALS, NANOCRYSTALS AND NANOSTRUCTURED MATERIALS BY X-R DIFFRACTION METHODS
   Contents
Topic Sub-topic
1. Introduction to the crystallography. Basic concepts. 1-Introduction to the Crystallography. Symbols and terms. Vectors, coefficients and coordinates. Space groups of symmetry
2. X-ray diffraction methods. 2.1 The intensities of X-ray diffracted beams: the structure factor equation and its applications.

2.2 Some applications of X-ray powder (polycrystalline) diffraction techniques.
Identification of unknown phases.
Accurate lattice parameter measurements.
Crystalline structures refinement from X-ray powder diffraction.
2.3 X-ray diffraction with High Temperature camera.
Polimorfisme and phase transition with temperature.
X-ray dilatometry. Thermal tensor of the anisotropic materials.

2.4 Tridimensional X-ray diffraction. Euler goniometer with Schulz geometry. Textur goniometer.
Thin films characterization.
Orientation of crystalline materials for cutting.
Textur characterization of polycrystalline materials.
3. Relation between crystalline structure and morphology. 3.1Crystals, nanocrystals and nanostructured materials.
Nucleation and crystal growth.
Size and shape versus growth conditions.
Relation between crystalline structure and morphology.
3.2 Curie principle and Wulff theorem for the equilibrium form and crystal growth form.
Models and exemples.
4.-Anisotropy and physical properties of materials. 4.1 Anisotropy and physical properties of materials.
Physical Properties as Tensors.
Neumann’s Principle.
The value of a physical property in a given direction.
Curie’s principle.