2009_10
Guia docent 
Escola Tècnica Superior d'Enginyeria
A A 
català 
Enginyeria Electrònica (2006)
 Assignatures
  CHARACTERIZATION OF CRYSTALS, NANOCRYSTALS AND NANOSTRUCTURED MATERIALS BY X-R DIFFRACTION METHODS
   Fonts d'informació
Bàsica
  • E. Hartmann. An introduction to Crystal Physics. Pu. International Union of Crystallography. Cardiff, 1984.
  • L.A. Shuvalov. Modern CrystallographyIV. Physical properties of crystals . Springer Verlag, 1988, pp.1-46
  • J.F. Nye. Physical properties of Crystals. Their representation by tensors and matrices. Oxford University Press, 1985, pp.3-48, pp.93-109.
  • B.D. Cullity. Elements of X-Ray Diffraction. Addison-Wesley Pu. Co., 1978.
  • R.A. Schwarzer. Texture and anisotropy of polycrystals. Trans. Tech. Pu., Germany, 1997.
  • A. Putnis. Introduction to the mineral Science. Cambridge University Press, 1992, pp.1-120.
  • R.A. Young.The Rietveld Method. Oxford University Press, 1995.
  • D.L.Bish and J.E.Post, Modern Powder Diffraction, Reviews in Mineralogy, V.20. Minera. Society of America. Washington, 1989.
  • Z.L Wang (edited by), Characterization of Nanophase materials, Wyley-VCH , Weinheim, 2000,pp.1-35; 315-350.
  • J.N. DiNardo. Nanoscale characterization of surfaces and interfaces. Wiley-VCH, Weinheim,1994.
  • P.J.Duke. Sincroton Radiation production and properties. Oxford University Press, 2000.
  • Complementària