2010_11
Guia docent 
Escola Tècnica Superior d'Enginyeria Química
A A A 
català 
Nanociència i Nanotecnologia (2010)
 Assignatures
  INTRODUCCIÓ A LES TÈCNIQUES DE CARACTERITZACIÓ
   Continguts
Tema Subtema
1. Introduction. Optical microscopy. Confocal microscopy. Applications and future perspectives.
2. Diffraction techniques to determine crystal structures. Bulk diffraction techniques: X-Ray Diffraction (XRD) and Neutron Diffraction (ND)
3. Scanning probe microscopy (SPM) and spectroscopy. Principle of operation. Scanning Tunneling microscopy (STM). Basic principles. Surface structure determination by STM. Scanning Tunneling spectroscopies. STM-based atomic manipulations. Recent developments and applications.
4. Atomic Force Microscope (AFM). Basic principles. Contact, Non-contact and Tapping AFM modes. Measuring local properties with AFM. Other scanning probe techniques. Applications to nanoscale materials.
5. Electron microscopy. General aspects of electron optics. Electron beam generation. Electron beam interactions. Scanning Electron Microscopy (SEM). Environmental Scanning Eletron Microscopy (ESEM). Transmission Electron Microscopy (TEM). Applications.
6. Electron Microscopy. Transmission Electron Microscopy (TEM). Applications.
7. Spectroscopy techiques. Photon spectroscopy: Photoluminiscence, Infrared and Raman vibrational spectroscopy, X-Ray spectroscopy. Electron spectroscopy: Electron induced spectroscopies in SEM and TEM. Applications to nanomaterials.