2010_11
Guia docent 
Escola Tècnica Superior d'Enginyeria Química
A A 
català 
Nanociència i Nanotecnologia (2010)
 Assignatures
  INTRODUCCIÓ A LES TÈCNIQUES DE CARACTERITZACIÓ
   Fonts d'informació
Bàsica YAO, N., WANG Z.L., Handbook of Microscopy for Nanotechnology, Kluver Academic Publishers, Last availabre edition
KELSALL, R., HAMLEY, I., GEOGHEGAN M., Nanoscale Science and Technology, Wiley, Last availabre edition
BIRDI, K.S., Scanning probe microscopes: applications in science and technology, CRC Press, Last availabre edition
GOLDSTEIN, J.I., Scanning electron microscopy and X-Ray microanalysis, Kluver Academic, Plenum Press, Last availabre edition
Paolo Samori, Scanning probe microscopies beyond imaging: manipulation of molecules and nanostructures, Weinheim: Wiley-VCH, Last available edition,

Complementària DI VENTRA, M., EVOY S., HEFLIN J.R., Introduction to Nanoscale Science and Nanotechnology, Kluver Academic Publishers, Last availabre edition
BHUSHAN, B, Springer Handbook of Nanotechnology, Springer, Last availabre edition
WILLIAMS, B., CARTER, C.B., Transmission electron microscopy. A text book for material science. Springer Handbook of Nanotechnology, Plenum Press, Last availabre edition
BRIGGS, D., SEAH, M.P., Practical surface analysis: By Auger and X-Ray photoelectron spectroscopy, Wiley, Last availabre edition
, Papers about recent trends in characterization techniques for nanostructures, ,