2018_19
Guia docent 
Escola Tècnica Superior d'Enginyeria Química
A A 
català 
Nanociència, Materials i Processos: Tecnologia Química de Frontera (2013)
 Assignatures
  INTRODUCCIÓ A LES TÈCNIQUES DE CARACTERIZACIÓ
   Fonts d'informació
Bàsica YAO, N., WANG Z.L., Handbook of Microscopy for Nanotechnology, Last available edition, Kluver Academic Publishers
KELSALL, R., HAMLEY, I., GEOGHEGAN M., Nanoscale Science and Technology, Last available edition, Wiley

Complementària DI VENTRA, M., EVOY S., HEFLIN J.R., Introduction to Nanoscale Science and Nanotechnology, Last available edition, Kluver Academic Publishers
BHUSHAN, B, Handbook of Nanotechnology, Last available edition, Springer
WILLIAMS, B., CARTER, C.B., Transmission electron microscopy. A text book for material science., Last available edition, Plenum Press
BRIGGS, D., SEAH, M.P., Practical surface analysis: By Auger and X-Ray photoelectron spectroscopy, Last available edition, Wiley
BIRDI, K.S., Scanning probe microscopes: applications in science and technology, Last available edition, CRC Press
GOLDSTEIN, J.I., Scanning electron microscopy and X-Ray microanalysis, Last available edition, Kluver Academic, Plenum Press
SAMORI, P., Scanning probe microscopies beyond imaging: manipulation of molecules and nanostructures, Last available edition, Weinheim: Wiley-VCH