2009_10
Guia docent 
Escola Tècnica Superior d'Enginyeria Química
A A A 
català 
Nanociència i Nanotecnologia (2006)
 Assignatures
  INTRODUCCIÓ A LES TÈCNIQUES DE CARACTERITZACIÓ
   Continguts
Tema Subtema
1. Introduction. Microscopy and Spectroscopy techniques for characterising nanostructures. Resolution and type of information obtained: morphology, crystal structure, chemistry and electronic structure.
2. Optical microscopy. Confocal microscopy. 4"pi" microscopy. Scanning Near Field Optical Microscopy. Applications and future perspectives.
3. Electron microscopy. General aspects of electron optics. Electron beam generation. Electron beam interactions. Scanning Electron Microscopy (SEM). Scanning Tunneling Microscopy. Applications.
4. Scanning probe microscopy (SPM) and spectroscopy. Principle of operation. Instrumentation and probes. Scanning probe techniques.
5. Scanning Tunneling microscopy (STM). Basic principles. Surface structure determination by STM. Scanning Tunneling spectroscopies. STM-based atomic manipulations. Recent developments and applications.
6. Atomic Force Microscope (AFM). Basic principles. Contact, Non-contact and Tapping AFM modes. Measuring local elastic properties with AFM. Other scanning probe techniques: Lateral Force Microscope, Magnetic Force Microscope, Electrostatic Force Microscope. Applications to nanoscale materials.
7. Diffraction techniques to determine crystal structures. Bulk diffraction techniques: X-Ray Diffraction (XRD) and Neutron Diffraction (ND). Surface diffration techniques: High energy electron diffraction (RHEED) and Low-energy electron diffraction (LEED).
8. Spectroscopy techniques. Photon spectroscopy: Photoluminiscence, Infrared and Raman vibrational spectroscopy, X-Ray spectroscopy. Electron spectroscopy: Electron induced spectroscopies in SEM and TEM, Electron energy loss spectroscopy. Applications to nanomaterials.
9. Surface analysis and depth profiling. Electron spectroscopy of surfaces: X-Ray Photoelectron spectroscopy (XPS) and Auger electron spectroscopy (AES). Mass spectrometry of surfaces. Applications.