IDENTIFYING DATA 2015_16
Subject (*) NANOFABRICATION AND NANOPROCESSING Code 20705206
Study programme
Nanoscience, Materials and Processes: Chemical Technology at the Frontier
Cycle 2nd
Descriptors Credits Type Year Period
4.5 Optional AN
Language
Anglès
Department Química Analítica i Química Orgànica
Coordinator
RIU RUSELL, JORDI
E-mail jordi.riu@urv.cat
xavier.borrise@urv.cat
manuel.varela@urv.cat
alberto.romano@urv.cat
francescxavier.perez@urv.cat
Lecturers
RIU RUSELL, JORDI
BORRISÉ NOGUÉ, XAVIER
VARELA FERNANDEZ, MANUEL
ROMANO RODRÍGUEZ, ALBERTO
PÉREZ MURANO, FRANCESC XAVIER
Web
General description and relevant information The overall objective of the subject is that students acquire basic knowledge of manufacturing processes with a resolution in the nanometer scale. The student will acquire the knowledge about their main areas of use, emphasizing the advantages and disadvantages of each of them. The specific objectives are: 1. To introduce to the student the fabrication, deposition and etching techniques suitable for nanotechnology applications 2. Discuss advantages and drawbacks, limitations and fields of applications of the different techniques presented presented 3. Establish complementarities of the different fabrication and processing techniques 4. Acquire the skills to critically propose the correct use of the techniques in different nanotechnology problems

Competences
Type A Code Competences Specific
 A1.1 A1.1. Successfully studying and learning about the chosen research ambit: evaluating the technical and scientific importance, the technological potential and the viability of the nanoscience, design, preparation, properties, processes, developments, techniques and applications of materials.
Type B Code Competences Transversal
 B1.1 B1.1. Communicating and discussing proposals and conclusions in specialized and non-specialized multilingual forums in a clear and unambiguous manner.
 B3.1 B3.1. Collaborative teamwork, with responsibility shared among multidisciplinary, multilingual and multicultural teams.
 B4.2 B4.2 Learning autonomously and by using initiative.
Type C Code Competences Nuclear
 C1.1 Have an intermediate mastery of a foreign language, preferably English
 C1.2 Be advanced users of the information and communication technologies
 C1.3 Be able to manage information and knowledge

Learning outcomes
Type A Code Learning outcomes
 A1.1 A1.1 Can formulate knowledge about the basic principles used in the field of nanofabrication and nanoprocessing, materials and the main techniques used in this area.
A1.1 Select the most appropriate nanofabrication methods to solve specific problems of nanotechnology.
Type B Code Learning outcomes
 B1.1 B1.1 Can intervene effectively and transmit relevant information.
B1.1 Plan their communication: generate ideas, seek information, select and order information, make schemes, decide on the audience and the aims of the communication, etc.
B1.1 Prepare and deliver structured presentations, complying with the requirements.
B1.1 Draft documents with the appropriate format, content, structure, language accuracy, and register, and can illustrate concepts using the correct conventions: format, headings, footnotes, captions, etc.
B1.1 Use language that is appropriate to the situation.
B1.1 Are aware of the strategies that can be used in oral presentations (audiovisual support, eye contact, voice, gesture, timing, etc.).
 B3.1 B3.1 Accept and comply with the rules of the group.
B3.1 Take active part in planning the team’s work, distributing tasks and respecting deadlines.
B3.1 Contribute to the positive management of any differences, disagreements and conflicts that arise in the team.
B3.1 Make their personal contribution in the time expected and with the resources available.
B3.1 Take active part and share information, knowledge and experiences.
B3.1 Take into account the points of view of others and give constructive feedback.
 B4.2 B4.2 Ask the appropriate questions for solving doubts or open questions, and search for information with criteria.
B4.2 Select a procedure from among the possibilities suggested by the lecturer.
Type C Code Learning outcomes
 C1.1 Express opinions on abstract or cultural topics in a limited fashion.
Explain and justify briefly their opinions and projects.
Understand instructions about classes or tasks assigned by the teaching staff.
Understand routine information and articles.
Understand the general meaning of texts that have non-routine information in a familiar subject area.
Write letters or take notes about foreseeable, familiar matters.
 C1.2 Understand basic computer hardware.
Understand the operating system as a hardware manager and the software as a working tool.
Use software for off-line communication: word processors, spreadsheets and digital presentations.
Use software for on-line communication: interactive tools (web, moodle, blogs, etc.), e-mail, forums, chat rooms, video conferences, collaborative work tools, etc.
 C1.3 Locate and access information effectively and efficiently.
Critically evaluate information and its sources, and add it to their own knowledge base and system of values.
Have a full understanding of the economic, legal, social and ethical implications of accessing and using information.
Reflect on, review and evaluate the information management process.

Contents
Topic Sub-topic
Introduction Introduction and preliminary concepts.
Chapter 1. Optical lithography Concept of optical lithography. Conventional optical lithography. Resist. Instrumentation. Microelectronics as the driving force for miniaturization. Limits of optical lithography. Advanced optical lithography.
Chapter 2. Electron beam lithography. Introduction to electron beam lithography. Optical electron systems: electron-beam lithography (EBL). Solids-electron interactions. Beam exposition: Resists. Proximity effects. Process technology. Applications.
Chapter 3. Focussed ion beam technology. Basics of ion-beam-solid interactions:Interactions of the ions with a target:
-Implantation of the primary ions
-Damage of the structure
-Emission of secondary atoms or ions (sputtering)
-Emission of secondary electrons
-Emission of secondary electrons
-Backscattering
-Deposition of molecules
-Ion channelling
FIB apparatus and Dual-Beam
Examples of FIB in the field of analysis
Examples of applications
Summary
Chapter 4. Non-conventional lithographyc techniques I: Atomic Force Microscopies. Lithographs based on near field microscopy: Introduction to scanning probe microscopy (SPM). Summary of scanning probe lithographic methods. Atomic manipulation (STM). Manipulation of objects and molecules. Indentation / local repository. Local oxidation nanolithography. Local dispensing of liquids and molecules (including Dip pen nanolithography). Nanofabrication in parallel.
Chapter 5. Non-conventional lithographyc techniques II: Embossing, imprinting and soft lithographies. Imprinting and embossing techniques. Thermoplastics: vitrious transition temperature. Hot embossing and NanoImprint Lithography (NIL). Curing of resists using UV light. Replica molding. Soft lithographies.
Chapter 6. Thin film deposition and growth.
Introduction. Thin film growth. Surface structure. Stages and processes. Epitaxy.
Deposition techniques. Physical techniques (PVD). Chemical techniques (CVD). PCVD techniques. Thin film characterization. In situ techniques. Ex situ techniques. Growth and Deposition Techniques.


Chapter 7. Thin film processing. Wet etching. Lift-off process. Plasma assisted etching. Reactive ion etching
Etching techniques. Dry etching. Vapour phase etching. Sputtering ion etching
Chapter 8. Global fabrication processes. Fabrication of complex structures using the techniques described in the previous topics. Proposed alternative and complementary techniques.

Planning
Methodologies  ::  Tests
  Competences (*) Class hours
Hours outside the classroom
(**) Total hours
Introductory activities
1 0 1
Lecture
A1.1
B4.2
25 50 75
Assignments
B1.1
B3.1
C1.1
6 12 18
Presentations / expositions
B1.1
C1.1
4 4 8
Personal tuition
3 4.5 7.5
 
Extended-answer tests
A1.1
C1.1
1 2 3
 
(*) On e-learning, hours of virtual attendance of the teacher.
(**) The information in the planning table is for guidance only and does not take into account the heterogeneity of the students.

Methodologies
Methodologies
  Description
Introductory activities Activities to make contact and collect student information. Presentation of the subject.
Lecture Delivery and explanation of the contents of the course.


Assignments Work done by the student.


Presentations / expositions Oral presentation by students of a particular subject or a (previously written presentation).


Personal tuition Time that each lecturer has booked to attend and answer questions to students.

Personalized attention
Description
Dr. Albert Romano: Prof. Albert Romano-Rodriguez Professor Titular d'Universitat MIND-IN2UB - Departament d'Electronica Universitat de Barcelona c/ Marti i Franques, 1 E-08028 Barcelona Spain tel: +34 93 403 91 56 FAX: +34 93 402 11 48 e-mail: aromano@el.ub.es Dr. Francesc Pérez-Murano: Prof. Francesc Perez-Murano NEMS and Nanofabrication IMB-CNM. CSIC CAMPUS UAB. 08193 Bellaterra.Spain Phone: +34 93 594 77 00 (ext. 2113) e-mail: francesc.perez@imb-cnm.csic.es Dr. Manuel Varela: M. Varela Applied Physics and Optics Dept. University of Barcelona c/ Martí i Franquès, 1 08028 Barcelona mvarela@ub.edu Xavier Borrisé (CNM-CSIC and ICN) Nanolithography Laboratory CAMPUS UAB. 08193 Bellaterra.Spain Phone: +34 93 5947700 ext 1104 e-mail: xavier.borrise@imb-cnm.csic.es

Assessment
Methodologies Competences Description Weight        
Assignments
B1.1
B3.1
C1.1
Group work on a very specific subject that students must work and present. 10-20%
Presentations / expositions
B1.1
C1.1
Students will be divided into groups and each group will conduct an oral exposition on the work they have developed during the course. 30-40%
Extended-answer tests
A1.1
C1.1
Tests which must develop one or ore topics 40-60%
Others  
 
Other comments and second exam session

During testing assessment, mobile phones, tablets and other devices that are not expressly authorized alectrònics for the test must be switched off and out of sight


Sources of information

Basic M.J. Madou , Fundamentals of microfabrication: the science of miniaturization. , CRC Press , 2002
B. Bushan et al. , Springer Handbook of Nanotechnology , Springer, 2006
J.N. Helbert, Handbook of VLSI Microlithography - Principles, Tools, Technology and Applications. , William Andrew Publishing/Noyes , 2001
H.S. Nalwa (editor) , Encyclopedia of nanoscience and nanotechnology , American Scientific Publishers , 2004
Z. Cui , Micro-Nanofabrication: Technology and Applications , Springer Verlag , 2006
M. Ohring , Materials Science of Thin Films , Academic Press , 2002
J.A. Venables , Introduction to Surface and Thin Film Processes , Cambridge University Press , 2001

Complementary

Journals in the field of Nanotechnology

Applied Physics and Chemical Synthesis

Proceedings of conferences in the field of the subject

Recommendations

Subjects that are recommended to be taken simultaneously
CLEAN ROOM TRAINING/20705207

(*)The teaching guide is the document in which the URV publishes the information about all its courses. It is a public document and cannot be modified. Only in exceptional cases can it be revised by the competent agent or duly revised so that it is in line with current legislation.