| Bàsica |
Ray F. Egerton, Physical Principles of Electron Microscopy : An Introduction to TEM, SEM, and AEM, Kluwer Academic-Plenum Publishers, 2005
N. Yao, Nan and Z. Wang, Zhong L., Handbook of Microscopy for Nanotechnology, Kluwer Academic-Plenum Publishers, 2005
M D.B. Williams, C.B. Carter, Transmission Electron Microscopy, Plenum Press, 1996
J.I. Glodstein, D. Newbury, D. Joy, C. Lyman, P. Echlin, E. Lifshin, L. Sawyer, and J. Michael, Scanning electron microscopy and X-Ray micronanalysis, 3rd ed., Kluwer Academic-Plenum Publishers, 2003
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| Complementària |
P. Goodhew, J. Humphreys, R. Beanland, Electron Microscopy and Analysis, 3 ed., Taylor & Francis, 2001
R.F. Egerton, Electron energy-loss spectroscopy in the electron microscope, 2 ed., Plenum Press, 1996
Fultz, Brent, Howe, James M., Transmission Electron Microscopy and Diffractometry of Materials, 2nd ed., Springer, 2002
D.E. Newbury, D.C. Joy, P. Echlin, C.E. Fiori and J.I. Glodstein, Advanced Scanning electron microscopy and X-Ray micronanalysis, 3rd ed., Kluwer Academic-Plenum Publishers, 2003
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