| Educational guide School of Engineering |
english |
| Electronic Engineering (2010) |
 Subjects |
| CHARACTERIZATION OF CRYSTALS, NANOCRYSTALS AND NANOSTRUCTURED MATERIALS BY X-R DIFFRACTION METHODS |
| Assessment |
| IDENTIFYING DATA | 2011_12 |
| Subject | CHARACTERIZATION OF CRYSTALS, NANOCRYSTALS AND NANOSTRUCTURED MATERIALS BY X-R DIFFRACTION METHODS | Code | 17605221 | |||||
| Study programme |
|
Cycle | 2nd | |||||
| Descriptors | Credits | Type | Year | Period | ||||
| 3 | Optional | Only annual |
||||||
| Competences | Learning aims | Contents |
| Planning | Methodologies | Personalized attention |
| Assessment | Sources of information | Recommendations |
| Description | Weight | ||
| Problem solving, classroom exercises | Resolució de problemes, exercicis a l'aula ordinària i lliurar un resum | 80 | |
| Practical tests | Realització d’un exercici pràctic i individual. | 20 | |
| Other comments and second exam session | |||
