Educational guide School of Chemical Engineering |
english |
Nanoscience, Materials and Processes: Chemical Technology at the Frontier |
Subjects |
INTRODUCTION TO CHARACTERIZATION TECHNIQUES |
Sources of information |
IDENTIFYING DATA | 2015_16 |
Subject | INTRODUCTION TO CHARACTERIZATION TECHNIQUES | Code | 20705208 | |||||
Study programme |
|
Cycle | 2nd | |||||
Descriptors | Credits | Type | Year | Period | ||||
3 | Optional | AN |
Competences | Learning outcomes | Contents |
Planning | Methodologies | Personalized attention |
Assessment | Sources of information | Recommendations |
Basic |
YAO, N., WANG Z.L., Handbook of Microscopy for Nanotechnology, Last available edition, Kluver Academic Publishers KELSALL, R., HAMLEY, I., GEOGHEGAN M., Nanoscale Science and Technology, Last available edition, Wiley |
Complementary |
DI VENTRA, M., EVOY S., HEFLIN J.R., Introduction to Nanoscale Science and Nanotechnology, Last available edition, Kluver Academic Publishers BHUSHAN, B, Handbook of Nanotechnology, Last available edition, Springer WILLIAMS, B., CARTER, C.B., Transmission electron microscopy. A text book for material science., Last available edition, Plenum Press BRIGGS, D., SEAH, M.P., Practical surface analysis: By Auger and X-Ray photoelectron spectroscopy, Last available edition, Wiley BIRDI, K.S., Scanning probe microscopes: applications in science and technology, Last available edition, CRC Press GOLDSTEIN, J.I., Scanning electron microscopy and X-Ray microanalysis, Last available edition, Kluver Academic, Plenum Press SAMORI, P., Scanning probe microscopies beyond imaging: manipulation of molecules and nanostructures, Last available edition, Weinheim: Wiley-VCH |