| Educational guide School of Chemical Engineering |
english |
| Nanoscience, Materials and Processes: Chemical Technology at the Frontier |
 Subjects |
| INTRODUCTION TO CHARACTERIZATION TECHNIQUES |
| Contents |
| IDENTIFYING DATA | 2018_19 |
| Subject | INTRODUCTION TO CHARACTERIZATION TECHNIQUES | Code | 20705208 | |||||
| Study programme |
|
Cycle | 2nd | |||||
| Descriptors | Credits | Type | Year | Period | ||||
| 3 | Optional | AN |
||||||
| Competences | Learning outcomes | Contents |
| Planning | Methodologies | Personalized attention |
| Assessment | Sources of information | Recommendations |
| Topic | Sub-topic |
| 1. Introduction. Optical microscopy. Confocal microscopy. Aplications and future. | |
| 2. Scanning probe microscopy (SPM). Background of the different techniques. Scanning tunnelling microscopy (STM). Basic principles. Determination of the surface by STM. Scanning and tunnelling spectroscopies. Atomic manipulation with STM. Recent advances and applications. | |
| 3. Atomic force microscopy (AFM). Basic principles. Dynamic and contact modes. Measuring local properties with AFM. Other SPM techniques. Applications to materials in the nanoscale. | |
| 4. Electron microscopy. General aspects. Generation of the beam of electrons. Interaction of electrons with matter. Scanning electron microscopy (SEM). Environmental scanning electron microscopy (ESEM). X-ray analysis in SEM/ESEM. Applications. | |
| 5. Transmission electron microscopy (TEM). Sample preparation. Applications. | |
| 6. Diffraction techniques for the determination of crystalline structures. X-ray diffraction (XRD). |
