Guia docent Escola Tècnica Superior d`Enginyeria Química |
català |
Nanociència i Nanotecnologia (2006) |
Assignatures |
INTRODUCCIÓ A LES TÈCNIQUES DE CARACTERITZACIÓ |
Continguts |
DADES IDENTIFICATIVES | 2008_09 |
Assignatura | INTRODUCCIÓ A LES TÈCNIQUES DE CARACTERITZACIÓ | Codi | 205151207 | |||||
Ensenyament |
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Cicle | 2on | |||||
Descriptors | Crèd. | Tipus | Curs | Període | ||||
2.5 | Optativa | Únic anual |
Competències | Objectius d'aprenentatge | Continguts |
Planificació | Metodologies | Atenció personalitzada |
Avaluació | Fonts d'informació | Recomanacions |
Tema | Subtema |
1. | Introduction. Microscopy and Spectroscopy techniques for characterising nanostructures. Resolution and type of information obtained: morphology, crystal structure, chemistry and electronic structure. |
2. | Optical microscopy. Confocal microscopy. 4"pi" microscopy. Scanning Near Field Optical Microscopy. Applications and future perspectives. |
3. | Electron microscopy. General aspects of electron optics. Electron beam generation. Electron beam interactions. Scanning Electron Microscopy (SEM). Scanning Tunneling Microscopy. Applications. |
4. | Scanning probe microscopy (SPM) and spectroscopy. Principle of operation. Instrumentation and probes. Scanning probe techniques. |
5. | Scanning Tunneling microscopy (STM). Basic principles. Surface structure determination by STM. Scanning Tunneling spectroscopies. STM-based atomic manipulations. Recent developments and applications. |
6. | Atomic Force Microscope (AFM). Basic principles. Contact, Non-contact and Tapping AFM modes. Measuring local elastic properties with AFM. Other scanning probe techniques: Lateral Force Microscope, Magnetic Force Microscope, Electrostatic Force Microscope. Applications to nanoscale materials. |
7. | Diffraction techniques to determine crystal structures. Bulk diffraction techniques: X-Ray Diffraction (XRD) and Neutron Diffraction (ND). Surface diffration techniques: High energy electron diffraction (RHEED) and Low-energy electron diffraction (LEED). |
8. | Spectroscopy techniques. Photon spectroscopy: Photoluminiscence, Infrared and Raman vibrational spectroscopy, X-Ray spectroscopy. Electron spectroscopy: Electron induced spectroscopies in SEM and TEM, Electron energy loss spectroscopy. Applications to nanomaterials. |
9. | Surface analysis and depth profiling. Electron spectroscopy of surfaces: X-Ray Photoelectron spectroscopy (XPS) and Auger electron spectroscopy (AES). Mass spectrometry of surfaces. Applications. |