| Educational guide School of Engineering |
english |
| Electronic Engineering (2010) |
 Subjects |
| CHARACTERIZATION OF CRYSTALS, NANOCRYSTALS AND NANOSTRUCTURED MATERIALS BY X-R DIFFRACTION METHODS |
 
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| IDENTIFYING DATA | 2011_12 | |||||||||||||||||
| Subject (*) | CHARACTERIZATION OF CRYSTALS, NANOCRYSTALS AND NANOSTRUCTURED MATERIALS BY X-R DIFFRACTION METHODS | Code | 17605221 | |||||||||||||||
| Study programme |
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Cycle | 2nd | |||||||||||||||
| Descriptors | Credits | Type | Year | Period | Exam timetables and dates | |||||||||||||
| 3 | Optional | Only annual |
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| Modality and teaching language | See working groups | |||||||||||||||||
| Prerequisites | ||||||||||||||||||
| Department | Química Física i Inorgànica |
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| Coordinator |
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magdalena.aguilo@urv.cat |
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| Lecturers |
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| Web | http://www.urv.net/perfils/7_alumnes_de_doctorat/marcos.htm | |||||||||||||||||
| General description and relevant information | Descripció de la terminologia bàsica emprada en Cristal·lografia. xarxa real, reciproca, Grups espacials. Difracció de Raigs X, principals tècniques i aplicacions | |||||||||||||||||
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| (*)The teaching guide is the document in which the URV publishes the information about all its courses. It is a public document and cannot be modified. Only in exceptional cases can it be revised by the competent agent or duly revised so that it is in line with current legislation. | ||||||||||||||||||
